Joo, Young-Chang
Joo, Young-Chang
Seoul National University · Materials Science and Engineering
About
전자재료의 신뢰성과 일렉트로마이그레이션 현상을 연구한다. 첨단 패키지에서의 마이그레이션 유발 고장, 층간 절연막의 Cu 마이그레이션, 솔더·Cu 필러 범프의 전기화학적 마이그레이션, MEMS·마이크로 파워 시스템 등을 다룬다.
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